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Microview RS-A1300-GM60-M00: Redefine the boundaries of industrial visual inspection accuracy and enable a new era of intelligent quality inspection for high-end manufacturing

Microview RS-A1300-GM60-M00: Redefine the boundaries of industrial visual inspection accuracy and enable a new era of intelligent quality inspection for high-end manufacturing

May 30,2025
In high-end manufacturing fields such as semiconductor packaging, lithium electrode sheet cutting, and photovoltaic thin film deposition, micron-level defect detection has become the core link in determining product yield. Microview's latest RS-A1300-GM60-M00 industrial visual inspection system, with cutting-edge optical architecture and AI algorithm integration, realizes 0.1μm-level defect recognition and nano-level three-dimensional measurement, providing strategic industries such as semiconductors and new energy with a technology transition tool from "sampling" to "full inspection". This high-resolution, high-speed, and high-intelligence visual system not only solves the accuracy bottleneck of traditional inspection solutions, but also promotes industrial quality inspection towards "autonomous diagnosis and predictive maintenance" through the trinity architecture of "optical hardware + intelligent software + industry knowledge base".


High-end manufacturing quality inspection upgrade is imminent, and traditional visual solutions encounter technical ceilings

As semiconductor manufacturing processes break through to 3nm and below nodes, the lithium electrode sheet cutting accuracy is required to reach ±5μm, and the photovoltaic film thickness uniformity error needs to be controlled within ±1%. The limitations of traditional industrial visual inspection solutions are becoming increasingly prominent. When a memory chip packaging and testing plant uses a 5-megapixel camera to detect BGA solder joints, the missed detection rate of void defects below 50μm is as high as 12%, resulting in an 8% increase in the early failure rate of terminal products; the pole sheet cutting production line of a power lithium battery company is forced to adopt a random inspection mode due to the insufficient response speed of the traditional visual system (detection speed <200fps) and cannot match the 150m/min high-speed production line, burying quality risks.
At the same time, the multi-variety small-batch production mode puts forward higher requirements for the flexibility of the visual system. When a consumer electronics foundry switches to different models of mobile phone shell detection, the parameter debugging time of the traditional solution is as long as 4 hours, which seriously affects the line change efficiency. The market urgently needs a next-generation visual system that can simultaneously meet "nano-level precision + high-speed detection + intelligent switching". Microview RS-A1300-GM60-M00 has achieved a technological breakthrough in this context, with a 13-megapixel global shutter camera and an AI defect classification engine, achieving a double leap in detection efficiency and accuracy.


Three major technological breakthroughs to build a new system of industrial visual inspection technology

Optical system innovation: a leap from "two-dimensional detection" to "three-dimensional characterization"
RS-A1300-GM60-M00 uses a 13-megapixel back-illuminated CMOS sensor and a 60mm GigE interface telecentric lens to achieve a resolution of 0.1μm/pixel, which is 3 times higher than the previous generation of products. Its original "multi-spectral coaxial illumination" technology can penetrate the surfaces of different materials (such as molding compounds for semiconductor packaging and coatings for lithium electrode sheets) through intelligent switching of red, green and blue three-wavelength LEDs and laser light sources, and accurately identify submicron defects. In a wafer-level packaging inspection, the system successfully identified a 3μm copper pillar bump offset, which is 70% higher than the 10μm detection limit of the traditional solution.


3D measurement engine: industrial implementation of nano-scale morphology analysis

The built-in laser triangulation module can achieve a 3D height measurement accuracy of ±50nm. In photovoltaic perovskite film inspection, the system calculates the thickness uniformity error by scanning the nano-level fluctuations on the film surface, and improves the accuracy of film quality determination from 85% to 99.2% compared with the traditional conductivity indirect measurement method. After a display panel manufacturer adopted this system, the Mura (uneven brightness) defect detection rate of OLED screens increased by 40%, and the yield increased from 88% to 95%, saving more than 50 million yuan in annual costs.
AI defect classification system: evolution from "manual annotation" to "autonomous learning"
The DeepView AI engine equipped with it can quickly adapt to new scenarios without a large amount of annotated data through transfer learning technology. The system's built-in "defect gene library" has accumulated 2000+ types of defect features in the semiconductor, lithium battery, photovoltaic and other industries. After a power device manufacturer used the system, the manual intervention rate of defect classification dropped from 30% to 5%, and the detection efficiency increased by 3 times. Its original "defect evolution prediction" function can predict the quality trend in the next 3 hours based on the current defect distribution, intervene in process adjustments in advance, and reduce batch quality accidents by 80%.
Benchmark applications in multiple industries: from laboratory technology to industrial value release
Semiconductor packaging: breaking through the bottleneck of advanced process quality inspection
In a 12-inch wafer flip-chip inspection, RS-A1300-GM60-M00 achieved a measurement accuracy of ±0.5μm for bump height (50μm) and ±1μm for coplanarity, meeting the stringent requirements of 3D packaging. The system's multi-station synchronous detection function reduces the single-wafer detection time from 12 minutes to 4 minutes, helping the packaging and testing plant to increase the high-end packaging capacity by 200%. More importantly, its built-in "defect traceability" module can associate defects with front-end process parameters through AI algorithms, which a memory chip factory uses to reduce the parameter optimization time of the welding process from 72 hours to 8 hours.


Lithium electrode sheet: the quality gatekeeper in high-speed production

After a power lithium battery company deployed the system on the electrode sheet cutting production line, it achieved full-size detection at a speed of 150m/min. The system's "dynamic distortion compensation" technology corrects image deformation in high-speed motion in real time, making the detection rate of electrode edge burrs (required to be <20μm) reach 99.8%, an increase of 30% over traditional solutions. At the same time, by analyzing the thickness fluctuation of the electrode coating, the system provides optimization suggestions for the coating process, which increases the thickness uniformity of the electrode from ±3% to ±1.5%, and extends the battery cycle life by 15%.
Photovoltaic thin film: precision revolution in green manufacturing
In the production of perovskite photovoltaic modules, the "thin film stress analysis" function of RS-A1300-GM60-M00 detects nano-level cracks on the surface of the film and predicts the failure risk after lamination in advance, reducing the early failure rate of the module from 5% to 0.8%. Its spectral analysis module can monitor the crystallization state of the perovskite layer in real time, widen the process window of thin film deposition from ±5℃ to ±10℃, and help a photovoltaic company increase the yield rate from 82% to 93%, and reduce the production cost per watt by 0.12 yuan.


Technology leads the future: from visual detection to intelligent manufacturing hub

The launch of Microview RS-A1300-GM60-M00 is not only a product upgrade, but also a reconstruction of the industrial quality inspection system. The system seamlessly connects with MES and ERP systems through open API interfaces, and has become a data hub for intelligent manufacturing. In a certain intelligent factory, visual inspection data accounts for 45% of production big data, providing core decision-making basis for process optimization, equipment maintenance, and supply chain management. The relevant person in charge of Microview said: "We are building a full-chain quality control ecosystem of 'detection-analysis-optimization-prediction'. In the future, we will use digital twins and edge AI technologies to achieve a leap from 'post-detection' to 'pre-prevention'."
With the development of technologies such as 5G and quantum computing, RS-A1300-GM60-M00 will be further upgraded to an "intelligent quality hub", which not only has defect detection capabilities, but also can continuously optimize detection strategies through cloud AI models to achieve autonomous evolution of equipment performance. In the foreseeable future, this visual system is expected to promote the transformation of high-end manufacturing from "qualified judgment" to "quality creation", provide core support for technological breakthroughs in strategic industries such as semiconductors and new energy, and help the global industry take a key step towards intelligence and precision.

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